BTI Arbitrary Stress Patterns Characterization & Machine-Learning optimized CET Maps Simulations - researchr publication authors

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L. Gerrer, Jacques Cluzel, F. Gaillard, Xavier Garros, Xavier Federspiel, Florian Cacho, David Roy 0001, E. Vincent. BTI Arbitrary Stress Patterns Characterization & Machine-Learning optimized CET Maps Simulations. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-5, IEEE, 2021. [doi]

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