Felix Gerschner, Jonas Paul, Lukas Schmid, Nico Barthel, Victor Gouromichos, Florian Schmid, Martin Atzmueller, Andreas Theissler. Domain Transfer for Surface Defect Detection using Few-Shot Learning on Scarce Data. In 21st IEEE International Conference on Industrial Informatics, INDIN 2023, Lemgo, Germany, July 18-20, 2023. pages 1-7, IEEE, 2023. [doi]
Abstract is missing.