Jiri Gesi, Jiawei Li, Iftekhar Ahmed 0001. An Empirical Examination of the Impact of Bias on Just-in-time Defect Prediction. In Filippo Lanubile, Marcos Kalinowski, Maria Teresa Baldassarre, editors, ESEM '21: ACM / IEEE International Symposium on Empirical Software Engineering and Measurement, Bari, Italy, October 11-15, 2021. ACM, 2021. [doi]
Abstract is missing.