Vadim Geurkov, Lev Kirischian. A Unified Method of Designing Signature Analyzers for Digital and Mixed-Signal Circuits Testing. In IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020. pages 1-5, IEEE, 2020. [doi]
@inproceedings{GeurkovK20,
title = {A Unified Method of Designing Signature Analyzers for Digital and Mixed-Signal Circuits Testing},
author = {Vadim Geurkov and Lev Kirischian},
year = {2020},
doi = {10.1109/ITC44778.2020.9325274},
url = {https://doi.org/10.1109/ITC44778.2020.9325274},
researchr = {https://researchr.org/publication/GeurkovK20},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020},
publisher = {IEEE},
isbn = {978-1-7281-9113-3},
}