Timing Vulnerability Factors of Ultra Deep-sub-micron CMOS - researchr publication

researchr

You are not signed in
Sign in
Sign up

Massoud Mokhtarpour Ghahroodi, Mark Zwolinski, Rick Wong, Shi-Jie Wen. Timing Vulnerability Factors of Ultra Deep-sub-micron CMOS. In 16th European Test Symposium (ETS 2011), May 23-27, 2011, Trondheim, Norway. pages 202, IEEE Computer Society, 2011. [doi]

Abstract is missing.

runs on WebDSL