Automatic assessment mark entry system using local binary pattern (LBP) and salient structural features

Lim Lam Ghai, Suhaila Badarol Hisham, Norashikin Yahya. Automatic assessment mark entry system using local binary pattern (LBP) and salient structural features. In 2014 IEEE International Conference on Control System, Computing and Engineering, ICCSCE 2014, Penang, Malaysia, November 28-30, 2014. pages 372-377, IEEE, 2014. [doi]

Abstract

Abstract is missing.