Ali Ghanbari 0001, Deepak-George Thomas, Muhammad Arbab Arshad, Hridesh Rajan. Mutation-based Fault Localization of Deep Neural Networks. In 38th IEEE/ACM International Conference on Automated Software Engineering, ASE 2023, Luxembourg, September 11-15, 2023. pages 1301-1313, IEEE, 2023. [doi]
Abstract is missing.