Gate Merging: An NBTI Mitigation Method to Eliminate Critical Internal Nodes in Digital Circuits - researchr publication authors

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Maryam Ghane, Hamid R. Zarandi. Gate Merging: An NBTI Mitigation Method to Eliminate Critical Internal Nodes in Digital Circuits. In 24th Euromicro International Conference on Parallel, Distributed, and Network-Based Processing, PDP 2016, Heraklion, Crete, Greece, February 17-19, 2016. pages 786-791, IEEE, 2016. [doi]

This author has not been identified. Look up 'Maryam Ghane' in GoogleThis author has not been identified. Look up 'Hamid R. Zarandi' in Google

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