Kamran Ghani, John A. Clark. Automatic Test Data Generation for Multiple Condition and MCDC Coverage. In Kenneth Boness, João M. Fernandes, Jon G. Hall, Ricardo Jorge Machado, Roy Oberhauser, editors, The Fourth International Conference on Software Engineering Advances, ICSEA 2009, 20-25 September 2009, Porto, Portugal. pages 152-157, IEEE Computer Society, 2009. [doi]
Abstract is missing.