Tunnel oxide degradation under pulsed stress - researchr publication authors

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G. Ghidini, C. Capolupo, G. Giusto, A. Sebastiani, B. Stragliati, M. Vitali. Tunnel oxide degradation under pulsed stress. Microelectronics Reliability, 45(9-11):1337-1342, 2005. [doi]

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