Morteza Gholipour, Ying-Yu Chen, Deming Chen. Compact Modeling to Device- and Circuit-Level Evaluation of Flexible TMD Field-Effect Transistors. IEEE Trans. on CAD of Integrated Circuits and Systems, 37(4):820-831, 2018. [doi]
@article{GholipourCC18,
title = {Compact Modeling to Device- and Circuit-Level Evaluation of Flexible TMD Field-Effect Transistors},
author = {Morteza Gholipour and Ying-Yu Chen and Deming Chen},
year = {2018},
doi = {10.1109/TCAD.2017.2729460},
url = {https://doi.org/10.1109/TCAD.2017.2729460},
researchr = {https://researchr.org/publication/GholipourCC18},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {37},
number = {4},
pages = {820-831},
}