Jayabrata Ghosh-Dastidar, Nur A. Touba. A Rapid and Scalable Diagnosis Scheme for BIST Environments with a Large Number of Scan Chains. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 79-88, IEEE Computer Society, 2000. [doi]
Abstract is missing.