Debjyoti Ghosh, Swarup Bhunia, Kaushik Roy. A Technique to Reduce Power and Test Application Time in BIST. In 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 12-14 July 2004, Funchal, Madeira Island, Portugal. pages 182-183, IEEE Computer Society, 2004. [doi]
Abstract is missing.