Archisman Ghosh, Debayan Das, Santosh Ghosh, Shreyas Sen. EM SCA & FI Self-Awareness and Resilience with Single On-chip Loop & ML Classifiers. In Cristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu, editors, 2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022. pages 592-595, IEEE, 2022. [doi]
@inproceedings{GhoshDGS22,
title = {EM SCA & FI Self-Awareness and Resilience with Single On-chip Loop & ML Classifiers},
author = {Archisman Ghosh and Debayan Das and Santosh Ghosh and Shreyas Sen},
year = {2022},
doi = {10.23919/DATE54114.2022.9774588},
url = {https://doi.org/10.23919/DATE54114.2022.9774588},
researchr = {https://researchr.org/publication/GhoshDGS22},
cites = {0},
citedby = {0},
pages = {592-595},
booktitle = {2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022},
editor = {Cristiana Bolchini and Ingrid Verbauwhede and Ioana Vatajelu},
publisher = {IEEE},
isbn = {978-3-9819263-6-1},
}