Soumyendu Sekhar Ghosh, Rajat Dhar, Daniel S. Marcus, Aristeidis Sotiras. Siam-VAE: a hybrid deep learning based anomaly detection framework for automated quality control of head CT scans. In Khan M. Iftekharuddin, Weijie Chen, editors, Medical Imaging 2023: Computer-Aided Diagnosis, San Diego, CA, USA, February 19-23, 2023. Volume 12465 of SPIE Proceedings, SPIE, 2023. [doi]
Abstract is missing.