Analog Circuit Design Methodologies to Improve Negative-Bias Temperature Instability Degradation - researchr publication authors

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Amlan Ghosh, Rob Franklin, Richard B. Brown. Analog Circuit Design Methodologies to Improve Negative-Bias Temperature Instability Degradation. In VLSI Design 2010: 23rd International Conference on VLSI Design, 9th International Conference on Embedded Systems, Bangalore, India, 3-7 January 2010. pages 369-374, IEEE, 2010. [doi]

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