Amlan Ghosh, Rob Franklin, Richard B. Brown. Analog Circuit Design Methodologies to Improve Negative-Bias Temperature Instability Degradation. In VLSI Design 2010: 23rd International Conference on VLSI Design, 9th International Conference on Embedded Systems, Bangalore, India, 3-7 January 2010. pages 369-374, IEEE, 2010. [doi]
@inproceedings{GhoshFB10,
title = {Analog Circuit Design Methodologies to Improve Negative-Bias Temperature Instability Degradation},
author = {Amlan Ghosh and Rob Franklin and Richard B. Brown},
year = {2010},
doi = {10.1109/VLSI.Design.2010.69},
url = {http://doi.ieeecomputersociety.org/10.1109/VLSI.Design.2010.69},
tags = {design},
researchr = {https://researchr.org/publication/GhoshFB10},
cites = {0},
citedby = {0},
pages = {369-374},
booktitle = {VLSI Design 2010: 23rd International Conference on VLSI Design, 9th International Conference on Embedded Systems, Bangalore, India, 3-7 January 2010},
publisher = {IEEE},
isbn = {978-0-7695-3928-7},
}