Iterative Parallel Test to Detect and Diagnose Multiple Defects for Digital Microfluidic Biochip

Sourav Ghosh, Dolan Maity, Arijit Chowdhury, Surajit Kumar Roy, Chandan Giri. Iterative Parallel Test to Detect and Diagnose Multiple Defects for Digital Microfluidic Biochip. In 28th IEEE Asian Test Symposium, ATS 2019, Kolkata, India, December 10-13, 2019. pages 147-152, IEEE, 2019. [doi]

Abstract

Abstract is missing.