Archisman Ghosh, Md. Abdur Rahman, Debayan Das, Santosh Ghosh, Shreyas Sen. Power and EM SCA Resilience in 65nm AES-256 Exploiting Clock-Slew Dependent Variability in CMOS Digital Circuits. In IEEE Custom Integrated Circuits Conference, CICC 2023, San Antonio, TX, USA, April 23-26, 2023. pages 1-2, IEEE, 2023. [doi]
Abstract is missing.