Material Classification Using Morphological Pattern Spectrum for Extracting Textural Features from Material Micrographs

D. Ghosh, David C. Tou Wei. Material Classification Using Morphological Pattern Spectrum for Extracting Textural Features from Material Micrographs. In P. J. Narayanan, Shree K. Nayar, Heung-Yeung Shum, editors, Computer Vision - ACCV 2006, 7th Asian Conference on Computer Vision, Hyderabad, India, January 13-16, 2006, Proceedings, Part II. Volume 3852 of Lecture Notes in Computer Science, pages 623-632, Springer, 2006. [doi]

@inproceedings{GhoshW06,
  title = {Material Classification Using Morphological Pattern Spectrum for Extracting Textural Features from Material Micrographs},
  author = {D. Ghosh and David C. Tou Wei},
  year = {2006},
  doi = {10.1007/11612704_62},
  url = {http://dx.doi.org/10.1007/11612704_62},
  tags = {classification, C++},
  researchr = {https://researchr.org/publication/GhoshW06},
  cites = {0},
  citedby = {0},
  pages = {623-632},
  booktitle = {Computer Vision - ACCV 2006, 7th Asian Conference on Computer Vision, Hyderabad, India, January 13-16, 2006, Proceedings, Part II},
  editor = {P. J. Narayanan and Shree K. Nayar and Heung-Yeung Shum},
  volume = {3852},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {3-540-31244-7},
}