D. Ghosh, David C. Tou Wei. Material Classification Using Morphological Pattern Spectrum for Extracting Textural Features from Material Micrographs. In P. J. Narayanan, Shree K. Nayar, Heung-Yeung Shum, editors, Computer Vision - ACCV 2006, 7th Asian Conference on Computer Vision, Hyderabad, India, January 13-16, 2006, Proceedings, Part II. Volume 3852 of Lecture Notes in Computer Science, pages 623-632, Springer, 2006. [doi]
@inproceedings{GhoshW06, title = {Material Classification Using Morphological Pattern Spectrum for Extracting Textural Features from Material Micrographs}, author = {D. Ghosh and David C. Tou Wei}, year = {2006}, doi = {10.1007/11612704_62}, url = {http://dx.doi.org/10.1007/11612704_62}, tags = {classification, C++}, researchr = {https://researchr.org/publication/GhoshW06}, cites = {0}, citedby = {0}, pages = {623-632}, booktitle = {Computer Vision - ACCV 2006, 7th Asian Conference on Computer Vision, Hyderabad, India, January 13-16, 2006, Proceedings, Part II}, editor = {P. J. Narayanan and Shree K. Nayar and Heung-Yeung Shum}, volume = {3852}, series = {Lecture Notes in Computer Science}, publisher = {Springer}, isbn = {3-540-31244-7}, }