D. Ghosh, David C. Tou Wei. Material Classification Using Morphological Pattern Spectrum for Extracting Textural Features from Material Micrographs. In P. J. Narayanan, Shree K. Nayar, Heung-Yeung Shum, editors, Computer Vision - ACCV 2006, 7th Asian Conference on Computer Vision, Hyderabad, India, January 13-16, 2006, Proceedings, Part II. Volume 3852 of Lecture Notes in Computer Science, pages 623-632, Springer, 2006. [doi]
Abstract is missing.