George C. Giakos, R. Guntupalli, J. Alexis De Abreu Garcia, N. Shah, Srinivasan Vedantham, Sankararaman Suryanarayanan, Samir Chowdhury, N. Patnekar, S. Sumrain, K. Mehta, Edward A. Evans, A. Orozco, V. Kumar, Okechukwu C. Ugweje, A. Moholkar. Intrinsic sensitivity of Cd::1-x::Zn::x::Te semiconductors for digital radiographic imaging. IEEE T. Instrumentation and Measurement, 52(5):1559-1565, 2003. [doi]
Abstract is missing.