George C. Giakos, R. Guntupalli, N. Shah, Srinivasan Vedantham, Sankararaman Suryanarayanan, Samir Chowdhury, Richard Nemer, A. G. Passerini, K. Mehta, S. Sumrain, N. Patnekar, K. Nataraj, Edward A. Evans, R. E. Endorf, F. Russo. Detected contrast and dynamic range measurements of CdZnTe semiconductors for flat-panel digital radiography. IEEE T. Instrumentation and Measurement, 50(6):1604-1609, 2001. [doi]
Abstract is missing.