Interlaboratory Nanoamp Current Comparison With Subpart-Per-Million Uncertainty

Stephen P. Giblin, Dietmar Drung, Martin Götz, Hansjörg Scherer. Interlaboratory Nanoamp Current Comparison With Subpart-Per-Million Uncertainty. IEEE T. Instrumentation and Measurement, 68(6):1996-2002, 2019. [doi]

Authors

Stephen P. Giblin

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Dietmar Drung

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Martin Götz

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Hansjörg Scherer

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