Interlaboratory Nanoamp Current Comparison With Subpart-Per-Million Uncertainty

Stephen P. Giblin, Dietmar Drung, Martin Götz, Hansjörg Scherer. Interlaboratory Nanoamp Current Comparison With Subpart-Per-Million Uncertainty. IEEE T. Instrumentation and Measurement, 68(6):1996-2002, 2019. [doi]

Abstract

Abstract is missing.