Parallel Test Pattern Generation Using Circuit Partitioning in a Shared-Memory Multiprocessor - researchr publication authors

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Consolación Gil, Julio Ortega, José Luis Bernier, Maria Dolores Gil Montoya. Parallel Test Pattern Generation Using Circuit Partitioning in a Shared-Memory Multiprocessor. In Bo Kågström, Jack Dongarra, Erik Elmroth, Jerzy Wasniewski, editors, Applied Parallel Computing, Large Scale Scientific and Industrial Problems, 4th International Workshop, PARA 98, Umeå, Sweden, June 14-17, 1998, Proceedings. Volume 1541 of Lecture Notes in Computer Science, pages 167-171, Springer, 1998.

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