Consolación Gil, Julio Ortega, José Luis Bernier, Maria Dolores Gil Montoya. Parallel Test Pattern Generation Using Circuit Partitioning in a Shared-Memory Multiprocessor. In Bo Kågström, Jack Dongarra, Erik Elmroth, Jerzy Wasniewski, editors, Applied Parallel Computing, Large Scale Scientific and Industrial Problems, 4th International Workshop, PARA 98, Umeå, Sweden, June 14-17, 1998, Proceedings. Volume 1541 of Lecture Notes in Computer Science, pages 167-171, Springer, 1998.
@inproceedings{GilOBG98,
title = {Parallel Test Pattern Generation Using Circuit Partitioning in a Shared-Memory Multiprocessor},
author = {Consolación Gil and Julio Ortega and José Luis Bernier and Maria Dolores Gil Montoya},
year = {1998},
tags = {testing, partitioning},
researchr = {https://researchr.org/publication/GilOBG98},
cites = {0},
citedby = {0},
pages = {167-171},
booktitle = {Applied Parallel Computing, Large Scale Scientific and Industrial Problems, 4th International Workshop, PARA 98, Umeå, Sweden, June 14-17, 1998, Proceedings},
editor = {Bo Kågström and Jack Dongarra and Erik Elmroth and Jerzy Wasniewski},
volume = {1541},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {3-540-65414-3},
}