Annealing-based heuristics and genetic algorithms for circuit partitioning in parallel test generation

Consolación Gil, Julio Ortega, Antonio F. Díaz, Maria Dolores Gil Montoya. Annealing-based heuristics and genetic algorithms for circuit partitioning in parallel test generation. Future Generation Comp. Syst., 14(5-6):439-451, 1998. [doi]

Abstract

Abstract is missing.