Daniel Gil, Luis J. Saiz, Joaquin Gracia, Juan Carlos Baraza, Pedro J. Gil. Injecting intermittent faults for the dependability validation of commercial microcontrollers. In IEEE International High Level Design Validation and Test Workshop, HLDVT 2008, Incline Village, NV, USA, November 19-21, 2008. pages 177-184, IEEE, 2008. [doi]
Abstract is missing.