Test access mechanism for multiple identical cores

Grady Giles, Jing Wang, Anuja Sehgal, Kedarnath J. Balakrishnan, James Wingfield. Test access mechanism for multiple identical cores. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1-10, IEEE, 2009. [doi]

@inproceedings{GilesWSBW09,
  title = {Test access mechanism for multiple identical cores},
  author = {Grady Giles and Jing Wang and Anuja Sehgal and Kedarnath J. Balakrishnan and James Wingfield},
  year = {2009},
  doi = {10.1109/TEST.2009.5355560},
  url = {http://dx.doi.org/10.1109/TEST.2009.5355560},
  researchr = {https://researchr.org/publication/GilesWSBW09},
  cites = {0},
  citedby = {0},
  pages = {1-10},
  booktitle = {2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009},
  editor = {Gordon W. Roberts and Bill Eklow},
  publisher = {IEEE},
  isbn = {978-1-4244-4868-5},
}