Bayesian Experience Reuse for Learning from Multiple Demonstrators

Mike Gimelfarb, Scott Sanner, Chi-Guhn Lee. Bayesian Experience Reuse for Learning from Multiple Demonstrators. In Zhi-Hua Zhou, editor, Proceedings of the Thirtieth International Joint Conference on Artificial Intelligence, IJCAI 2021, Virtual Event / Montreal, Canada, 19-27 August 2021. pages 2425-2431, ijcai.org, 2021. [doi]

Authors

Mike Gimelfarb

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Scott Sanner

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Chi-Guhn Lee

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