Mike Gimelfarb, Scott Sanner, Chi-Guhn Lee. Bayesian Experience Reuse for Learning from Multiple Demonstrators. In Zhi-Hua Zhou, editor, Proceedings of the Thirtieth International Joint Conference on Artificial Intelligence, IJCAI 2021, Virtual Event / Montreal, Canada, 19-27 August 2021. pages 2425-2431, ijcai.org, 2021. [doi]
Abstract is missing.