EST: The New Frontier in Automatic Test-Pattern Generation

John Giraldi, Michael L. Bushnell. EST: The New Frontier in Automatic Test-Pattern Generation. In DAC. pages 667-672, 1990. [doi]

@inproceedings{GiraldiB90,
  title = {EST: The New Frontier in Automatic Test-Pattern Generation},
  author = {John Giraldi and Michael L. Bushnell},
  year = {1990},
  doi = {10.1145/123186.123434},
  url = {http://doi.acm.org/10.1145/123186.123434},
  tags = {testing},
  researchr = {https://researchr.org/publication/GiraldiB90},
  cites = {0},
  citedby = {0},
  pages = {667-672},
  booktitle = {DAC},
}