Effects of HPEM stress on GaAs low-noise amplifier from circuit to component scale

M. Girard, Tristan Dubois, P. Hoffmann, Geneviève Duchamp. Effects of HPEM stress on GaAs low-noise amplifier from circuit to component scale. Microelectronics Reliability, 88:914-919, 2018. [doi]

Abstract

Abstract is missing.