A flexible method to tolerate value sensor failures

Alain Girault, Huafeng Yu. A flexible method to tolerate value sensor failures. In Proceedings of 11th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2006, September 20-22, 2006, Diplomat Hotel Prague, Czech Republic. pages 86-93, IEEE, 2006. [doi]

@inproceedings{GiraultY06,
  title = {A flexible method to tolerate value sensor failures},
  author = {Alain Girault and Huafeng Yu},
  year = {2006},
  doi = {10.1109/ETFA.2006.355435},
  url = {http://dx.doi.org/10.1109/ETFA.2006.355435},
  researchr = {https://researchr.org/publication/GiraultY06},
  cites = {0},
  citedby = {0},
  pages = {86-93},
  booktitle = {Proceedings of 11th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2006, September 20-22, 2006, Diplomat Hotel Prague, Czech Republic},
  publisher = {IEEE},
}