Current-Based Data-Retention-Time Characterization of Gain-Cell Embedded DRAMs Across the Design and Variations Space

Robert Giterman, Andrea Bonetti, Ester Vicario Bravo, Tzachi Noy, Adam Teman, Andreas Burg. Current-Based Data-Retention-Time Characterization of Gain-Cell Embedded DRAMs Across the Design and Variations Space. IEEE Trans. on Circuits and Systems, 67-I(4):1207-1217, 2020. [doi]

Authors

Robert Giterman

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Andrea Bonetti

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Ester Vicario Bravo

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Tzachi Noy

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Adam Teman

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Andreas Burg

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