Robert Giterman, Andrea Bonetti, Ester Vicario Bravo, Tzachi Noy, Adam Teman, Andreas Burg. Current-Based Data-Retention-Time Characterization of Gain-Cell Embedded DRAMs Across the Design and Variations Space. IEEE Trans. on Circuits and Systems, 67-I(4):1207-1217, 2020. [doi]
Abstract is missing.