GC-eDRAM With Body-Bias Compensated Readout and Error Detection in 28-nm FD-SOI

Robert Giterman, Andrea Bonetti, Andreas Burg, Adam Teman. GC-eDRAM With Body-Bias Compensated Readout and Error Detection in 28-nm FD-SOI. IEEE Trans. on Circuits and Systems, 66-II(12):2042-2046, 2019. [doi]

Abstract

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