Predicting DRAM reliability in the field with machine learning

Ioana Giurgiu, Jacint Szabo, Dorothea Wiesmann, John Bird. Predicting DRAM reliability in the field with machine learning. In Xiaoyun Zhu, Indrajit Roy, editors, Proceedings of the 18th ACM/IFIP/USENIX Middleware Conference: Industrial Track, Las Vegas, NV, USA, December 11 - 15, 2017. pages 15-21, ACM, 2017. [doi]

Abstract

Abstract is missing.