Automatic measurement system for the DC and low-f noise characterization of FETs at wafer level - researchr publication authors

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Gino Giusi, O. Giordano, Graziella Scandurra, Carmine Ciofi, Matteo Rapisarda, Sabrina Calvi. Automatic measurement system for the DC and low-f noise characterization of FETs at wafer level. In 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, Pisa, Italy, May 11-14, 2015. pages 2095-2100, IEEE, 2015. [doi]

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