Gino Giusi, O. Giordano, Graziella Scandurra, Carmine Ciofi, Matteo Rapisarda, Sabrina Calvi. Automatic measurement system for the DC and low-f noise characterization of FETs at wafer level. In 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, Pisa, Italy, May 11-14, 2015. pages 2095-2100, IEEE, 2015. [doi]
@inproceedings{GiusiGSCRC15,
title = {Automatic measurement system for the DC and low-f noise characterization of FETs at wafer level},
author = {Gino Giusi and O. Giordano and Graziella Scandurra and Carmine Ciofi and Matteo Rapisarda and Sabrina Calvi},
year = {2015},
doi = {10.1109/I2MTC.2015.7151606},
url = {https://doi.org/10.1109/I2MTC.2015.7151606},
researchr = {https://researchr.org/publication/GiusiGSCRC15},
cites = {0},
citedby = {0},
pages = {2095-2100},
booktitle = {2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, Pisa, Italy, May 11-14, 2015},
publisher = {IEEE},
isbn = {978-1-4799-6114-6},
}