Sebastian Glab, Mateusz Baszczyk, Piotr Dorosz, Wojciech Kucewicz, Maria Sapor, Lukasz Mik. Characterization of transistors fabricated in evolving lapis semiconductor silicon-on-insulator 0.2µm technology. In Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2013, Gdynia, Poland, June 20-22, 2013. pages 360-364, IEEE, 2013. [doi]
Abstract is missing.