Markus Glaß, Birgit Möller, Anne Zirkel, Kristin Wächter, Stefan Hüttelmaier, Stefan Posch. Scratch Assay Analysis with Topology-Preserving Level Sets and Texture Measures. In Jordi Vitrià, João Miguel Raposo Sanches, Mario Hernández, editors, Pattern Recognition and Image Analysis - 5th Iberian Conference, IbPRIA 2011, Las Palmas de Gran Canaria, Spain, June 8-10, 2011. Proceedings. Volume 6669 of Lecture Notes in Computer Science, pages 100-108, Springer, 2011. [doi]
@inproceedings{GlassMZWHP11,
title = {Scratch Assay Analysis with Topology-Preserving Level Sets and Texture Measures},
author = {Markus Glaß and Birgit Möller and Anne Zirkel and Kristin Wächter and Stefan Hüttelmaier and Stefan Posch},
year = {2011},
doi = {10.1007/978-3-642-21257-4_13},
url = {http://dx.doi.org/10.1007/978-3-642-21257-4_13},
tags = {analysis},
researchr = {https://researchr.org/publication/GlassMZWHP11},
cites = {0},
citedby = {0},
pages = {100-108},
booktitle = {Pattern Recognition and Image Analysis - 5th Iberian Conference, IbPRIA 2011, Las Palmas de Gran Canaria, Spain, June 8-10, 2011. Proceedings},
editor = {Jordi Vitrià and João Miguel Raposo Sanches and Mario Hernández},
volume = {6669},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-642-21256-7},
}