Electrical characterization of different types of transistors fabricated in VeSTIC process

Grzegorz Gluszko, Daniel Tomaszewski, Krzysztof Domanski. Electrical characterization of different types of transistors fabricated in VeSTIC process. In 24th International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2017, Bydgoszcz, Poland, June 22-24, 2017. pages 132-136, IEEE, 2017. [doi]

Abstract

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