Efficient 3D characterization of raised topological defects in smooth specular coatings

Pradeep Gnanaprakasam, Johné M. Parker, Subburengan Ganapathiraman, Zhen Hou. Efficient 3D characterization of raised topological defects in smooth specular coatings. Image Vision Comput., 27(4):319-330, 2009. [doi]

Abstract

Abstract is missing.