Evaluation of design for reliability techniques in embedded flash memories - researchr publication authors

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Benoît Godard, Jean Michel Daga, Lionel Torres, Gilles Sassatelli. Evaluation of design for reliability techniques in embedded flash memories. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 1593-1598, ACM, 2007. [doi]

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