Sangharatna Godboley, Joxan Jaffar, Rasool Maghareh, Arpita Dutta. Toward optimal mc/dc test case generation. In Cristian Cadar, Xiangyu Zhang 0001, editors, ISSTA '21: 30th ACM SIGSOFT International Symposium on Software Testing and Analysis, Virtual Event, Denmark, July 11-17, 2021. pages 505-516, ACM, 2021. [doi]
Abstract is missing.