Anshu Goel, Rohini Gulve. Multi-mode Toggle Random Access Scan to Minimize Test Application Time. In Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh, editors, VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers. Volume 711 of Communications in Computer and Information Science, pages 205-216, Springer, 2017. [doi]
@inproceedings{GoelG17, title = {Multi-mode Toggle Random Access Scan to Minimize Test Application Time}, author = {Anshu Goel and Rohini Gulve}, year = {2017}, doi = {10.1007/978-981-10-7470-7_21}, url = {https://doi.org/10.1007/978-981-10-7470-7_21}, researchr = {https://researchr.org/publication/GoelG17}, cites = {0}, citedby = {0}, pages = {205-216}, booktitle = {VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers}, editor = {Brajesh Kumar Kaushik and Sudeb Dasgupta and Virendra Singh}, volume = {711}, series = {Communications in Computer and Information Science}, publisher = {Springer}, isbn = {978-981-10-7470-7}, }