Effective and Efficient Test Architecture Design for SOCs

Sandeep Kumar Goel, Erik Jan Marinissen. Effective and Efficient Test Architecture Design for SOCs. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 529-538, IEEE Computer Society, 2002. [doi]

Authors

Sandeep Kumar Goel

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Erik Jan Marinissen

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