Zero-Temperature-Coefficient Biasing Point of a Fully-Depleted SOI MOSFET - researchr publication authors

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Ashok K. Goel, Terrence H. Tan. Zero-Temperature-Coefficient Biasing Point of a Fully-Depleted SOI MOSFET. In Rex E. Gantenbein, Sung Y. Shin, editors, Proceedings of the ISCA 17th International Conference Computers and Their Applications, April 4-6, 2002, Canterbury Hotel, San Francisco, California, USA. pages 454-457, ISCA, 2002.

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